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Recent Advances in Analytical Electron Microscopy for Irradiated Materials
Chad M. Parish
,
Philip D Edmondson
,
Kevin G. Field
,
Kurt A. Terrani
,
Rachel L. Seibert
,
Yutai Katoh
January 2016
Type
Journal article
Publication
In: Transactions of the American Nuclear Society, (114), 1,
pp. 1034
Related
Recent Advances in Analytical Electron Microscopy for Irradiated Materials
LAMDA: A facility for advanced characterization of irradiated materials at Oak Ridge national laboratory
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