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Development and deployment of automated machine learning detection in electron microcopy experiments
Kevin G Field
,
Ryan Jacobs
,
Mingen Shen
,
Matthew Lynch
,
Priyam Patki
,
Christopher Field
,
Dane Morgan
January 2021
Type
Journal article
Publication
In: Microscopy and Microanalysis, (27), S1,
pp. 2136–2137
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Real-time, On-Microscope Automated Quantification of Features in Microcopy Experiments Using Machine Learning and Edge Computing
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